Hello,

I have a custom cascade board which only supports external 1.3V RF power. It does not support bypassing the internal RF LDO on the chip.

I would like to explore whether I can still operate this board in simultaneous 3TX mode. Are there any ways to accomplish this while still using the internal 1V LDO? Would it be feasible to backoff the TX power by a couple of dB to relax the power draw on the internal LDO?

Thanks,
Antonio

↧

BQ25703A: puzzle me with some parameter

October 28, 2019, 6:34 pm

≫ Next: BQ35100: BQ35100: Calibration problem

≪ Previous: AWR1243: Simultaneous 3TX

Part Number: BQ25703A

Recently, I used the charging chip bq25703a for a new design. The application scenario is to charge 4-cell NiMH batteries. It is assumed that the final voltage which 4-cell NiMH batteries are fully charged is 6V. The parameter of chip about maximum charging voltage is set to 5.8v as fast charging mode.

There are two questions needed to be confirmed:

1.the MAX SYSTEM VOLTAGE REGULATION(the term is mentioned in datasheet) is the voltage at which the battery is expected to be fully charged. Is it right that i understood?

2.when the batteries voltage is charged to about 5.78V , and the adapter input current is only about 100-200mA. Why is the fast charge flag IN_FCHRG of register(21/20h) which i used to judge the batteries is charged fully still 1 ?

Thank you very much!

↧

BQ35100: BQ35100: Calibration problem

October 28, 2019, 6:37 pm

≫ Next: LAUNCHXL-CC1352P: Getting access to MAC timer

≪ Previous: BQ25703A: puzzle me with some parameter

Part Number: BQ35100

bq35100 detect EVE_ER34615 (19000mAh) lithium thionyl chloride (Li-SOCl2) battery

1、when I calibrate CC offset and board offset, the bqstudio report:Calibration- Current flow across sense resistor, Please ensure no current is flowing and retry calibration.

I get the info from:https://e2e.ti.com/support/power-management/f/196/p/785441/2912877#2912877

CC Offset and Board Offset are values which are changed during the calibration procedure using the calibration plug-in. These short across SRN and SRP internally and open SRN and SRP internally when 0 current is flowing to calculate CC Offset (Short SRN-SRP) and Board Offset (Open SRN-SRP).

Short and open SRN-SRP can do this to finish calibration for bq35100?

2、my battery :EVE_ER34615 (19000mAh) lithium thionyl chloride (Li-SOCl2) cel

Programming the chem id programs the OCV table and the resistance tables.

about these tables infos, Now I have a problem: OCV table and the resistance tables data how i can flash to my project?

when my project enter mass produce, I will have so many chips, I can`t flash it by bqstudio.

Programming the chem id programs only when I bringup the bq35100 chip.

how can i do?

thanks.

↧

LAUNCHXL-CC1352P: Getting access to MAC timer

October 28, 2019, 6:51 pm

≫ Next: AWR1642: Question for AWR1642

≪ Previous: BQ35100: BQ35100: Calibration problem

Part Number: LAUNCHXL-CC1352P

Hi,

Can somebody kindly point me to where I can find documentation for the MAC internal timer?

I've looked through the CC13x2, CC26x2 SimpleLink™ Wireless MCU Technical Reference Manual (Rev. D)

but didn't see anything specific about the MAC internal timer. I'm trying to get to the source of timestamp in the ApiMac_mcpsDataInd_t

struct. I can get access to timestamp2 which is from RF_getCurrentTime(), but I would appreciate where to find docs for the MAC timer.

Thanks

↧

AWR1642: Question for AWR1642

October 28, 2019, 7:06 pm

≫ Next: ADS131A04: Data acquisition values fluctuate under specific conditions.

≪ Previous: LAUNCHXL-CC1352P: Getting access to MAC timer

Part Number: AWR1642

Hi Team,

Customer does not use CLI in 16xx_people_counting. He wants to write the dead parameter by calling the subroutine corresponding to the CLI, but the subroutine corresponding to some parameters cannot be found. EG: “dfeDataOutputMode 1”和“channelCfg 15 3 0”
The subroutine of the corresponding parameter set was not found in the CLI_Cfg list. What is going on?

Thanks.

↧

ADS131A04: Data acquisition values fluctuate under specific conditions.

October 28, 2019, 7:10 pm

≫ Next: AM26C31: Higher output load-rated differential line-drivers/receivers, or different device type construct an incremental encoder output signal splitter (fanout)

≪ Previous: AWR1642: Question for AWR1642

Part Number: ADS131A04

Subject: Data acquisition values fluctuate under specific conditions.

I am trying to use ADS131A04.

The prototype board (manual wiring) was able to get data without problems.

The variation in the acquired data was judged to be excellent because it was within 20 counts.

So I made a printed circuit board.

Unfortunately, there were fluctuations of up to 1000 counts or more in the acquired data under certain conditions.

That is, when the voltage applied to AVDD is changed, the acquired data varies in the voltage range around 4.9V.

Even when the prototype A / D is connected in parallel and operated simultaneously,

The problem does not occur in the prototype A / D, but only in the A / D on the substrate side.

(If the prototype A / D is connected in parallel, the variation will be smaller and the voltage range will change slightly.)

Therefore, it is not a problem such as oscillation in the analog part,

I think there is a problem with A / D.

The graph below shows the A / D value while lowering the AVDD voltage manually.

(A / D on printed circuit board and A / D on prototype board.)

It can be seen that the problem occurred when the AVDD voltage was around 4.9V.

There are minor symptoms at other voltages such as around 4.7V.

The power supply voltage and the reference voltage were also examined by simultaneous capture, but no fluctuations that could be causal were found.

I was worried about mistakes in digital data, and I added a CRC.

There was no CRC error.

Is there a problem with routing the printed circuit board pattern? I think, but I would appreciate any advice.

↧

AM26C31: Higher output load-rated differential line-drivers/receivers, or different device type construct an incremental encoder output signal splitter (fanout)

October 28, 2019, 7:11 pm

≫ Next: The GUI cannot be modified by the GUI in the mmwave vital signal routine

≪ Previous: ADS131A04: Data acquisition values fluctuate under specific conditions.

Part Number: AM26C31

Hi,

I need to connect up to 16 servo drives to the quadrature output of one incremental rotary encoder, which serves as the master-axis for all the other drive to follow (electronic-gearing). These drives have the ability to internally scale the master encoder signals to create an "electronic line shaft" or "electronic gear train". We're using the electronic-gearing capability of these drives for this mid-range system rather than the EtherCAT motion controller we use on our more advanced systems, and in this case it is much more desirable to follow one single master encoder axis rather than daisy-chain encoder signals from drive to drive.

The industrial incremental encoders we typically use are available with 5Vdc / 20mA Push-Pull (totem pole) outputs. or 5Vdc / 20mA differential line-driver outputs (AM26C31 equivalent). The shielded cable runs from the encoder to the servo drives is less than 15ft (5m) in length max. Maximum signal rate (frequency) would be 100Khz.

Servo drive encoder inputs: 6.28mA at 5Vdc

One configuration I think could work would be: Use the push-pull encoder outputs (20A max per channel) for the A/B/Z channels & connect them to the inputs of a pair (2) AM26C31 quadruple differential line driver chips. The two (2) AM26C31 line-drivers can support up to ten (10) AM26C32 differential line-receivers each, but to be conservative I'll say eight (8) in this case. If each servo drive encoder input channel is rated at 6.28mA at 5Vdc, each AM26C32 output channel (20mA) could comfortably support two servo drives.

Encoder A/B/Z channel outputs connected to three of four (3 of 4) inputs of two (2) AM26C31 quad differential line-drivers, with eight (8) AM26C32 receivers connected to each AM26C31 driver = 16 single-ended encoder outputs (16A/16B/16Z). If the servo drives draw 6.28mA, then I could theoretically connect two (2) servo drives (12.6mA combined) to each AM26C32 output, which would theoretically yield 32 possible servo drives connected to one rotary incremental encoder on the master conveyor axis.

Question 1: Am I correct with this scheme?

Question 2: If the above method would work, is there a newer or better device type I should be considering? RS-422 differential line-drivers have been around a long time, so I'd hate to miss out on a better or more robust method of encoder output signal splitting (fanout) Re: greater output load capacity, superior square wave output, or isolation between nodes/axis?

Thank you and kind regards.

↧

The GUI cannot be modified by the GUI in the mmwave vital signal routine

October 28, 2019, 7:16 pm

≫ Next: AWR1642BOOST: triangular wave for AWR1642

≪ Previous: AM26C31: Higher output load-rated differential line-drivers/receivers, or different device type construct an incremental encoder output signal splitter (fanout)

Hi Team,

The customer is experiencing below issue and needs your help.

1. When running the GUI, the UART is com3, DATA is com4, but the settings cannot be modified. This makes it impossible to collect data. Is there any way to resolve it?

2. Can the GUI interface be modified by himself? Running the .m file separately does not pop up the interface.

Thanks.

↧

AWR1642BOOST: triangular wave for AWR1642

October 28, 2019, 7:24 pm

≫ Next: BQ27426: problems reading and writing to subclass areas

≪ Previous: The GUI cannot be modified by the GUI in the mmwave vital signal routine

Part Number: AWR1642BOOST

Hi Team,

Customer would like to know how does the AWR1642 use the DCA1000 to alternately generate a positive slope and a negative slope to simulate a triangular wave?

Thanks.

↧

BQ27426: problems reading and writing to subclass areas

October 28, 2019, 7:29 pm

≫ Next: DS25BR440: DS25BR440 Output data response with PWDN

≪ Previous: AWR1642BOOST: triangular wave for AWR1642

Part Number: BQ27426

I read on a previous thread how the data sheet is incorrect and the capacity is at 46 47 address. I have followed the

bq27426
Technical Reference

page 18 for setting the battery design capacity but cannot read the data. I am writing everything in assembly so this should be pretty straight forward unless the data sheet is not correct.

When I read the control status byte after startup, I get the SS bit as low which means it is unSealed. Which seemed very strange. So I Sealed it by sending a 20 command sequence (AA 00 20 00). The SS bit went high. I sent the sequence AA 00 00 00 80 twice and the SS bit gets cleared.

I then send AA 00 13 00. I read the 06 flag and see bit 4 go high. This bit goes high before my first read of 06 which I thought might be a problem based on the note that this could take up to one second.

I send AA 61 00, AA 3E 52, AA 3F 00

I then send a AA 60 AB and then read the byte for the checksum. It always comes back as a 00.

I also try to read 46 and 47 but also always get 00 for both.

Any ideas what is wrong. I can read the all the bytes in the regular ram like FullChargeCapacityUnfiltered() and StateOfChargeUnfiltered(). But I cannot read the buffer areas for the subclass 82 for the battery capacity and energy at 46 47 48 and 49.

↧

DS25BR440: DS25BR440 Output data response with PWDN

October 28, 2019, 7:31 pm

≫ Next: CCS/TMS320C6748: C6748 StarterWare SD Card Example Issue, write ERROR

≪ Previous: BQ27426: problems reading and writing to subclass areas

Part Number: DS25BR440

Hi,

For my design, LOS and PWDN are short together so that when LOS output LOW, the LVDS will power down. Could someone provide the following parameters: Ta, Tb, Tc and Td which are the time delay for LOSsignal to response with respect to input data and time delay for the output data to response with respect to power down behavior. Thanks.

↧

CCS/TMS320C6748: C6748 StarterWare SD Card Example Issue, write ERROR

October 28, 2019, 7:35 pm

≫ Next: TLC6C5912-Q1: Drain-to-Source parasitic capacitance of output FET

≪ Previous: DS25BR440: DS25BR440 Output data response with PWDN

Part Number: TMS320C6748

Tool/software: Code Composer Studio

Hi,

As C6748 StarterWare didnot supply any example for READ/WRITE sectors of SD card, I search in E2E forum.

I found this thread https://e2e.ti.com/support/processors/f/791/t/283373, it looks like the example I'm looking for.

I download the attached 2045.starterware_c6748_mmcsd.zip, and create a project in CCS. The it works well in CmdLineProcess, I can access the microSD card on LCDKC6748 board through Serial terminal.

The issue is, there‘s’ ERROR occured when WRITING file.

Test code is as follows：

#define     RING_BUF_SIZE   1024

unsigned char test_Buf[RING_BUF_SIZE];
/*fill test buff*/
static void fill_buf(unsigned char *buf)
{
    unsigned int i;
    for(i=0; i<RING_BUF_SIZE/2; i++) {
        *buf++ = 'D';
        *buf++ = 'g';
    }
}
/*write sectors test*/
void SD_write_sector_test(void)
{
    DRESULT res;
    UINT i;
    fill_buf(test_Buf);
    for(i=0;i<3;i++) {
        res = disk_write(0, test_Buf, 0x50 + i, 1);//write correct and return RES_OK
    }
    for(i=0;i<3;i++) {
        res = disk_write(0, test_Buf, 0x53 + i*2, 2);//write correct，BUT return RES_ERROR
    }
}
/*read sectors test*/
void SD_read_sector_test(void)
{
    DRESULT res;
    fill_buf(test_Buf);
    res = disk_read(0, test_Buf, 0xA0000/512, 1);//return RES_OK
    res = disk_read(0, test_Buf, 0xA0200/512, 2);//return RES_OK
}
/*create test.txt in TF card, and write some data*/
void SD_write_speed_test(void)
{
    FRESULT res;
    UINT i;
    WORD bytes_writed;
    FIL rec_file_chlm;

    res = f_open(&rec_file_chlm, "test.txt", FA_CREATE_ALWAYS | FA_WRITE);

    if (FR_OK != res) {
       return;
    }
    fill_buf(test_Buf);
    i = 100;
    while(i--) {
        res = f_write(&rec_file_chlm, test_Buf, RING_BUF_SIZE, &bytes_writed); //return FR_RW_ERROR
        f_sync(&rec_file_chlm);
    }
    f_close(&rec_file_chlm);
}

test code in main()'s for(;;) is as follows:

for(;;)
    {
        if((MMCSDCardPresent(&ctrlInfo)) == 1)
        {
#if DEBUG_PRINT
            UARTPuts("Card is present\r\n", -1);
#endif
            if(initFlg)
            {
                UARTPuts("Call MMCSDFsMount\r\n", -1);
                MMCSDFsMount(0, &sdCard);
                UARTPuts("Back MMCSDFsMount\r\n", -1);
                initFlg = 0;
                UARTPuts("Call Cmd_help\r\n", -1);
                Cmd_help(0, NULL);
                SD_write_speed_test();// xxx keep UNComment，make sure SD card was initialized.
                SD_read_sector_test();// XXX  
                SD_write_sector_test();// xxx 
            }
            MMCSDFsProcessCmdLine();
        }
        else
        {
UARTPuts("Card is not present\r\n", -1);
delay(1000);
//          delay(1);

            i = (i + 1) & 0xFFF;

            if(i == 1)
            {
                 UARTPuts("Please insert the card \r\n", -1);
            }

            if(initFlg != 1)
            {
                 /* Reinitialize all the state variables */
                 dmaIsRunning = 0;
                 xferCompFlag = 0;
                 dataTimeout  = 0;
                 dataCRCError = 0;
                 cmdCompFlag  = 0;
                 cmdTimeout   = 0;

                 /* Initialize the MMCSD controller */
                 MMCSDCtrlInit(&ctrlInfo);

                 MMCSDIntEnable(&ctrlInfo);
            }

            initFlg = 1;
        }
    }

Is there any other SD sectors read/write examples？

↧

TLC6C5912-Q1: Drain-to-Source parasitic capacitance of output FET

October 28, 2019, 7:35 pm

≫ Next: ADS1013-Q1: About FSR of single ended

≪ Previous: CCS/TMS320C6748: C6748 StarterWare SD Card Example Issue, write ERROR

Part Number: TLC6C5912-Q1

Hi all,

Can you tell me the drain-to-source parasitic capacitance of output FET when the FET is off or the TLC6C5912-Q1 is disabled as below?

Thank you,
RYO

↧

ADS1013-Q1: About FSR of single ended

October 28, 2019, 7:37 pm

≫ Next: DS90UB960-Q1: The driver patch of DS90UB960-Q1

≪ Previous: TLC6C5912-Q1: Drain-to-Source parasitic capacitance of output FET

Part Number: ADS1013-Q1

Hi team,

Can you please answer the following question?

Is ADS1013-Q1 available only up to 2.048V with single-ended input?

To measure 3.3V input, can ADS1013-Q1 be replaced directly with ADS1014-Q1?

Thanks,

Sam Lee

↧

DS90UB960-Q1: The driver patch of DS90UB960-Q1

October 28, 2019, 7:37 pm

≫ Next: DRA746: Song ID3 information appears garbled

≪ Previous: ADS1013-Q1: About FSR of single ended

Part Number: DS90UB960-Q1

Hi team

I am debugging the DS90UB960WRTDTQ1 chip on imx8mq,But I did not get the driver patch.

Could you provide the chip driver for me ?

BRs

thanks

↧

DRA746: Song ID3 information appears garbled

October 28, 2019, 7:39 pm

≫ Next: LM25145: External SYNCIN Signal Skipping

≪ Previous: DS90UB960-Q1: The driver patch of DS90UB960-Q1

Part Number: DRA746

There are two songs of Eason,ID3 appears garbled.They are normal on Windows 7 (Please visit the site to view this audio)(Please visit the site to view this audio)