I am using EZSDK 5.05.02, with NAND-related patches back ported from PSP_04.04.00.02 (EZSDK 5.05.02 comes with PSP 04.04.00.01). Things are working quite well, but I am running in to data corruption when running the mtd-utils nandtest program for longer periods of time (~12+hrs). Specifically, I see that eventually the comparison test fails. Example output:
Finished pass 2463 successfully
067a0000: checking...
Finished pass 2464 successfully
067a0000: checking...
Finished pass 2465 successfully
02c80000: reading...
1 bit(s) ECC corrected at 02c80000
02c80000: checking...
Byte 0xdc03 is 3a should be 38
This seems very similar to the following entry in the "Known Issues" section of PSP 4.04.00.02:
| SDOCM00096734 | NAND: 1-bit data corruption observed while running stress test |
What I would like to know is: Is this likely to be the same issue? Is the test proceedure the same (ie is the PSP test also 'nandtest', and does it fail in the same way)? and, is there an known patch that I can apply to fix the issue? Any time-frame for the resolution of this issue?
Thanks,
Joel