Part Number: DP83TC811S-Q1
Dear TI team:
We encountered some problems when testing EMC,please help to analyze:
We use dp83tc811s-q1 Ethernet chip (Master device) to assist test another dp83tc811s-q1 Ethernet chip (Slave device). But when Master device is working, the RE and CE test's environmental noise the test results will be greatly affected at 30M~200M, as below:
-- RE Master device is working
-- RE Master device is power off
-- CE Master device is working
-- CE Master devices is power off
We also did the verification test as below:
We use the same dp83tc811s-q1 Ethernet chip device, and download Master and Slave software separately. Then we do the RE and CE test, the test result is close to the above.
Please help us to check whether it can be optimized by hardware and software design?
Thanks!
Regard!
ZeKun.Wang